Simultaneous imaging of dielectric properties and topography in a PbTiO3 crystal by near-field scanning microwave microscopy
نویسندگان
چکیده
We use a near-field scanning microwave microscope to simultaneously image the dielectric constant, loss tangent, and topography in a PbTiO3 crystal. By this method, we study the effects of the local dielectric constant and loss tangent in the geometry of periodic domains on the measured resonant frequency, and quality factor. We also carry out theoretical calculations and the results agree well with the experimental data and reveal the anisotropic nature of the dielectric constant. © 2000 American Institute of Physics. @S0003-6951~00!05022-1#
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NEAR-FIELD IMAGING OF THE MICROWAVE DIELECTRIC PROPERTIES OF SINGLE-CRYSTAL PbTiO3 AND THIN-FILM Sr1 xBaxTiO3
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